git-svn-id: svn://svn.code.sf.net/p/chibios/svn/trunk@2805 35acf78f-673a-0410-8e92-d51de3d6d3f4

master
gdisirio 2011-03-06 10:58:06 +00:00
parent 7342884408
commit 6c69a81ca1
2 changed files with 5 additions and 5 deletions

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@ -89,9 +89,9 @@
IRQ handling faster and also saves some RAM/ROM space. The GCC port code
now does not inline the epilogue code in each ISR saving significan ROM
space for each interrupt handler in the system (backported to 2.2.3).
- NEW: Added "IRQ STORM" long duration tests for the STM32 and LPC11xx. The
test demonstrates the system stability in a thread-intensive, progressively
CPU-saturating, IRQ-intensive long duration test.
- NEW: Added "IRQ STORM" long duration tests for the STM32, LPC11xx and
LPC11xx. The test demonstrates the system stability in a thread-intensive,
progressively CPU-saturating, IRQ-intensive long duration test.
- NEW: Added two new functions to the events subsystem: chEvtBroadcastFlags()
and chEvtBroadcastFlagsI(). The old chEvtBroadcast() and chEvtBroadcastI()
become macros. The new functions allow to add the same flags to all the

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@ -19,6 +19,8 @@ Within 2.3.x (hopefully)
* Improvements to the message passing mechanism in order to allow "delayed,
out of order, responses".
* New device driver models: GPT.
X GPT implementation and long duration "IRQ storm" stress test applications
for all the supported critical platforms.
- Add UART4 support to the STM32 UART driver (CL line only, HD has a nasty
shared interrupt).
- Add ADC3 support to the STM32 ADC driver.
@ -29,8 +31,6 @@ Within 2.3.x (hopefully)
with the compiler info.
- Test suite overhaul, the API should be more generic in order to be used
with different subsystems and not just the kernel.
- Long duration "IRQ storm" stress test applications for all supported
architectures.
- Device drivers for STM8/STM8L (ADC, PWM, bring them on par with STM32).
- Device drivers for LPC1xxx (ADC, PWM, bring them on par with STM32).
- Implement USB Mass Storage Class support and demo using the MMC_SPI driver