From 6c69a81ca1eda2824359f0ad265c00d842e22f66 Mon Sep 17 00:00:00 2001 From: gdisirio Date: Sun, 6 Mar 2011 10:58:06 +0000 Subject: [PATCH] git-svn-id: svn://svn.code.sf.net/p/chibios/svn/trunk@2805 35acf78f-673a-0410-8e92-d51de3d6d3f4 --- readme.txt | 6 +++--- todo.txt | 4 ++-- 2 files changed, 5 insertions(+), 5 deletions(-) diff --git a/readme.txt b/readme.txt index 5b0f0865a..3edbd9fee 100644 --- a/readme.txt +++ b/readme.txt @@ -89,9 +89,9 @@ IRQ handling faster and also saves some RAM/ROM space. The GCC port code now does not inline the epilogue code in each ISR saving significan ROM space for each interrupt handler in the system (backported to 2.2.3). -- NEW: Added "IRQ STORM" long duration tests for the STM32 and LPC11xx. The - test demonstrates the system stability in a thread-intensive, progressively - CPU-saturating, IRQ-intensive long duration test. +- NEW: Added "IRQ STORM" long duration tests for the STM32, LPC11xx and + LPC11xx. The test demonstrates the system stability in a thread-intensive, + progressively CPU-saturating, IRQ-intensive long duration test. - NEW: Added two new functions to the events subsystem: chEvtBroadcastFlags() and chEvtBroadcastFlagsI(). The old chEvtBroadcast() and chEvtBroadcastI() become macros. The new functions allow to add the same flags to all the diff --git a/todo.txt b/todo.txt index 7e16194b9..4931ceed7 100644 --- a/todo.txt +++ b/todo.txt @@ -19,6 +19,8 @@ Within 2.3.x (hopefully) * Improvements to the message passing mechanism in order to allow "delayed, out of order, responses". * New device driver models: GPT. +X GPT implementation and long duration "IRQ storm" stress test applications + for all the supported critical platforms. - Add UART4 support to the STM32 UART driver (CL line only, HD has a nasty shared interrupt). - Add ADC3 support to the STM32 ADC driver. @@ -29,8 +31,6 @@ Within 2.3.x (hopefully) with the compiler info. - Test suite overhaul, the API should be more generic in order to be used with different subsystems and not just the kernel. -- Long duration "IRQ storm" stress test applications for all supported - architectures. - Device drivers for STM8/STM8L (ADC, PWM, bring them on par with STM32). - Device drivers for LPC1xxx (ADC, PWM, bring them on par with STM32). - Implement USB Mass Storage Class support and demo using the MMC_SPI driver